Invention Grant
- Patent Title: Failure symptom report device and method for detecting failure symptom
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Application No.: US14505949Application Date: 2014-10-03
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Publication No.: US09658908B2Publication Date: 2017-05-23
- Inventor: Hiroshi Otsuka , Yukihiro Watanabe , Yasuhide Matsumoto
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-219914 20131023; JP2014-189926 20140918
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; H04L12/26 ; H04L12/24

Abstract:
A failure symptom report device includes a processor configured to receive a message output from a system and related to configuration equipment of the system, and detect presence or absence of each of failure alerts. The failure alerts are generated in response to the received message on basis of detection conditions respectively. The detection conditions are respectively defined in accordance with different characteristics. The processor is configured to associate an actually occurred failure with a combination of the detected presence or absence of each of the failure alerts, count performance of failure prediction for each combination of the detected presence or absence of each of the failure alerts, and determine presence or absence of a failure symptom on basis of the counted performance of failure prediction and a combination of presence or absence of each of the failure alerts generated in response to a currently received message.
Public/Granted literature
- US20150113337A1 FAILURE SYMPTOM REPORT DEVICE AND METHOD FOR DETECTING FAILURE SYMPTOM Public/Granted day:2015-04-23
Information query