Invention Grant
- Patent Title: Particle improvement for single wafer apparatus
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Application No.: US14455761Application Date: 2014-08-08
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Publication No.: US09659794B2Publication Date: 2017-05-23
- Inventor: Ming-Sung Hung , Yu-Kuei Lee , Cheng-Nan Kao , Hung-Hsin Liang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McDermott Will & Emery LLP
- Main IPC: H01L21/304
- IPC: H01L21/304 ; H01L21/67

Abstract:
An apparatus includes a susceptor, a first piping, a second piping, a liquid source, a third piping and a gas source. The susceptor is suitable for placing a wafer, and the first piping is configured to dispense a chemical to the wafer on the susceptor. The second piping communicates with the first piping. The liquid source is configured to deliver a cleaning liquid to the first piping through the second piping to wash a portion of the first piping. The third piping communicates with the first piping. The gas source is configured to flow a purge gas to the first piping through the third piping to purge the portion of the first piping.
Public/Granted literature
- US20160040286A1 PARTICLE IMPROVEMENT FOR SINGLE WAFER APPARATUS Public/Granted day:2016-02-11
Information query
IPC分类: