Invention Grant
- Patent Title: Method for forming semiconductor components having self-aligned trench contacts
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Application No.: US14736961Application Date: 2015-06-11
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Publication No.: US09660047B2Publication Date: 2017-05-23
- Inventor: Martin Poelzl
- Applicant: Infineon Technologies Austria AG
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L21/332
- IPC: H01L21/332 ; H01L29/66 ; H01L29/40 ; H01L29/423 ; H01L29/739 ; H01L29/78 ; H01L21/033 ; H01L21/311 ; H01L21/768 ; H01L21/308 ; H01L29/06 ; H01L29/10 ; H01L29/417

Abstract:
A method for producing a semiconductor component includes providing a semiconductor body having a first semiconductor material extending to a first surface and at least one trench, the at least one trench extending from the first surface into the semiconductor body, a first insulation layer being arranged in the at least one trench. The method further includes forming a second insulation layer on the first surface having a recess that overlaps in a projection onto the first surface with the at least one trench, forming a mask region in the recess, etching the second insulation layer selectively to the mask region, depositing a third insulation layer over the first surface, and etching the third insulation layer so that a semiconductor mesa of the semiconductor body arranged next to the at least one trench is exposed at the first surface.
Public/Granted literature
- US20150279962A1 Method for Forming Semiconductor Components Having Self-Aligned Trench Contacts Public/Granted day:2015-10-01
Information query
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