Invention Grant
- Patent Title: Plated instrumentation probes and sensors
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Application No.: US14331771Application Date: 2014-07-15
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Publication No.: US09663867B2Publication Date: 2017-05-30
- Inventor: Shari L. Bugaj , Wendell V. Twelves, Jr. , Grant O. Cook, III
- Applicant: United Technologies Corporation
- Applicant Address: US CT Farmington
- Assignee: United Technologies Corporation
- Current Assignee: United Technologies Corporation
- Current Assignee Address: US CT Farmington
- Agency: Kinney & Lange, P.A.
- Main IPC: G01D21/00
- IPC: G01D21/00 ; C25D5/48 ; C25D5/02 ; C25D7/00 ; C23C18/16 ; G01D5/20 ; C25D5/10 ; C23C18/30

Abstract:
A component comprises a non-metallic core having an outer surface, a first catalyst deposited onto at least a first portion of the outer surface of the non-metallic core, a second catalyst deposited onto at least a second portion of the outer surface of the non-metallic core, an electrical interface, and a metallic coating. The electrical interface is plated onto the first catalyst, and includes a first interface layer electroless plated onto the first catalyst. The metallic coating is plated onto the second catalyst.
Public/Granted literature
- US20150013480A1 PLATED INSTRUMENTATION PROBES AND SENSORS Public/Granted day:2015-01-15
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