Invention Grant
- Patent Title: Noise detection circuit and semiconductor system using the same
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Application No.: US14310661Application Date: 2014-06-20
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Publication No.: US09671446B2Publication Date: 2017-06-06
- Inventor: Tae Wook Kang
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: William Park & Associates Ltd.
- Priority: KR10-2014-0036214 20140327
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01R31/317 ; G01R31/30

Abstract:
A noise detection circuit may include a divider configured to receive a clock signal and a clock bar signal, divide the clock signal and the clock bar signal, and generate a first divided signal and a second divided signal. The noise detection circuit may also include a noise detection reference block configured to reflect a power supply voltage level variation on the first divided signal and the second divided signal, and generate a first reference signal and a second reference signal, and a duty sensing circuit configured to generate first duty information and second duty information of the clock signal in response to the first reference signal and the second reference signal. The noise detection circuit may also include a detection circuit configured to generate a noise detection signal in response to the first duty information and the second duty information.
Public/Granted literature
- US20150276841A1 NOISE DETECTION CIRCUIT AND SEMICONDUCTOR SYSTEM USING THE SAME Public/Granted day:2015-10-01
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