Invention Grant
- Patent Title: Increasing the dynamic range of an integrator based mutual-capacitance measurement circuit
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Application No.: US15094744Application Date: 2016-04-08
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Publication No.: US09671916B2Publication Date: 2017-06-06
- Inventor: Ingar Hanssen , Rian Whelan
- Applicant: Atmel Corporation
- Applicant Address: US CA San Jose
- Assignee: Atmel Corporation
- Current Assignee: Atmel Corporation
- Current Assignee Address: US CA San Jose
- Agency: Baker Botts L.L.P.
- Main IPC: G06F3/044
- IPC: G06F3/044 ; H03K17/96 ; G01R27/26 ; G06F3/041 ; G06F3/038

Abstract:
In one embodiment, a device comprises one or more memory units collectively storing logic configured to cause one or more processors to perform operations. The operations comprise: obtaining a first measurement associated with a first voltage output by a mutual-capacitance measurement circuit; obtaining a second measurement associated with a second voltage, the second voltage output by the mutual-capacitance measurement circuit in response to a first change in capacitance; obtaining a third measurement associated with a third voltage output by the mutual capacitance measurement circuit, the third voltage being different from the first voltage; and obtaining a fourth measurement associated with a fourth voltage, the fourth voltage output by the mutual-capacitance measurement circuit in response to a second change in capacitance. The operations further comprise calculating a differential measurement using a difference between the first measurement and the second measurement and a difference between the third measurement and the fourth measurement.
Public/Granted literature
- US20160224160A1 Increasing the Dynamic Range of an Integrator Based Mutual-Capacitance Measurement Circuit Public/Granted day:2016-08-04
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