- Patent Title: Multi-core device, test device, and method of diagnosing failure
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Application No.: US14158170Application Date: 2014-01-17
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Publication No.: US09672128B2Publication Date: 2017-06-06
- Inventor: Sungho Kang , Taewoo Han
- Applicant: Industry-Academic Cooperation Foundation, Yonsei University
- Applicant Address: KR Seoul
- Assignee: Industry-Academic Cooperation Foundation, Yonsei University
- Current Assignee: Industry-Academic Cooperation Foundation, Yonsei University
- Current Assignee Address: KR Seoul
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2013-0006036 20130118
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/22 ; G06F11/267

Abstract:
Provided is a multi-core device. The multi-core device includes: a plurality of cores outputting a test response value by receiving a test pattern value; a majority analyzer outputting a value corresponding to a majority of the test response value by analyzing the test response value; and a determination unit determining a core outputting a test response value different from the value corresponding to the majority among the plurality of cores.
Public/Granted literature
- US20140208165A1 MULTI-CORE DEVICE, TEST DEVICE, AND METHOD OF DIAGNOSING FAILURE Public/Granted day:2014-07-24
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