Invention Grant
- Patent Title: Testing tray
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Application No.: US14618109Application Date: 2015-02-10
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Publication No.: US09672129B2Publication Date: 2017-06-06
- Inventor: Long Yu , Fang-Quan Li , Ju-Lan Hao , Li-Jun Li , Yan-Bin Liu
- Applicant: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD. , HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agent Steven Reiss
- Priority: CN201410052636 20140217
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G06F11/273

Abstract:
A testing tray includes a receiving member and a connector. The receiving includes a tray and a latching member. The tray includes a bottom wall, a peripheral sidewall protruded from the bottom wall, a resisting member and a guide groove. The resisting member includes a resisting portion and two elastic portions coupling the resisting portion with the peripheral sidewall. The tray includes at least one latching portion protruded from the peripheral sidewall. The latching member includes a sliding portion slidably mounted on the bottom wall to cover the guide groove and an elastic member located between the sliding portion and the bottom wall. The connector includes a fixed member detachably mounted on the at least one latching portion and a conducting member detachably mounted on the fixed member. The conducting member is capable of coupling the electronic device with a testing device.
Public/Granted literature
- US20150233968A1 TESTING TRAY Public/Granted day:2015-08-20
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