A system for testing over-current fault detection includes a first switch to connect a voltage to a load and a capacitor; a first monitor circuit that monitors a current from the first switch to the load; a second monitor circuit that monitors a voltage across the capacitor; and a microcontroller configured to control a state of the first switch to connect voltage to the load and verifies over-current detection based upon current generated during charging of the capacitor. The microcontroller detects an over-current fault condition based upon input from the first monitor circuit and detects a short-circuit fault condition based upon input from the second monitor circuit during test of the first monitor circuit.