Invention Grant
- Patent Title: Metrology timekeeping systems and methods
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Application No.: US14359180Application Date: 2012-11-19
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Publication No.: US09677908B2Publication Date: 2017-06-13
- Inventor: David Haynes
- Applicant: Aclara Technologies LLC
- Applicant Address: US MO Hazelwood
- Assignee: Aclara Technologies LLC
- Current Assignee: Aclara Technologies LLC
- Current Assignee Address: US MO Hazelwood
- Agency: Senniger Powers LLP
- International Application: PCT/US2012/065764 WO 20121119
- International Announcement: WO2013/078105 WO 20130530
- Main IPC: G08B23/00
- IPC: G08B23/00 ; G08C15/06 ; G08C19/20 ; G05D3/12 ; G01R15/00 ; G01D4/00 ; H04Q9/00

Abstract:
An advanced metering infrastructure (AMI) system includes a meter data management system, an AMI network, a network communication module and metering devices. The AMI network connects to a reference time clock and the meter data management system. The network communication module connects to the AMI network and is in communication with the reference time clock via the AMI network. Each metering device is connected to the network communication module and has a metrology device and a communication module device. The communication module device provides clock adjustments to the metrology clock and/or its own clock. The metrology device provides clock adjustments to the communications module clock and/or its own clock. Methods for use in an advanced metering infrastructure (AMI) system provide clock adjustments.
Public/Granted literature
- US20140320305A1 METROLOGY TIMEKEEPING SYSTEMS AND METHODS Public/Granted day:2014-10-30
Information query