Invention Grant
- Patent Title: Apparatus and method for automatic detection of diaphragm coating or surface contamination for capacitance diaphragm gauges
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Application No.: US14634805Application Date: 2015-02-28
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Publication No.: US09677964B2Publication Date: 2017-06-13
- Inventor: David J. Ferran , Robert J. Ferran
- Applicant: Ferran Technology, Inc.
- Applicant Address: US CA San Diego
- Assignee: FERRAN TECHNOLOGY, INC.
- Current Assignee: FERRAN TECHNOLOGY, INC.
- Current Assignee Address: US CA San Diego
- Agency: Patterson Intellectual Property Law, P.C.
- Agent Jerry Turner Sewell
- Main IPC: G01L27/00
- IPC: G01L27/00 ; G01L9/00 ; G01L21/00

Abstract:
A system and a method detect contamination of a diaphragm in a capacitance diaphragm gauge wherein a contaminated diaphragm deflects less in the presence of pressure than an uncontaminated diaphragm. The system and method measure a base pressure. A DC voltage is applied between the diaphragm and a fixed electrode to cause the diaphragm to deflect to simulate an effective pressure. The system and method measure a combined pressure caused by the base pressure and the effective pressure. The system and method subtract the base pressure to determine the effective pressure caused by the static diaphragm deflection. If the measured effective pressure is less than an acceptable effective pressure, the system and method determine that the diaphragm is contaminated.
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