Invention Grant
- Patent Title: System and method to monitor contact joint integrity
-
Application No.: US14190850Application Date: 2014-02-26
-
Publication No.: US09678137B2Publication Date: 2017-06-13
- Inventor: Bhyrav M. Mutnury , Sandor Farkas , Wallace H. Ables
- Applicant: Bhyrav M. Mutnury , Sandor Farkas , Wallace H. Ables
- Applicant Address: US TX Round Rock
- Assignee: Dell Products L.P.
- Current Assignee: Dell Products L.P.
- Current Assignee Address: US TX Round Rock
- Agency: Baker Botts L.L.P.
- Main IPC: G01R31/04
- IPC: G01R31/04

Abstract:
Methods and systems for monitoring contact joint integrity in an information handling system may include precisely monitoring a change in resistance of a resistive element associated with a contact joint. The change in resistance of the resistive element may be indicative of the integrity of the contact joint. The resistance may be measured using a modulated current source and by demodulating a voltage signal resulting from the modulated current flowing across the resistive element.
Public/Granted literature
- US20150241504A1 SYSTEM AND METHOD TO MONITOR CONTACT JOINT INTEGRITY Public/Granted day:2015-08-27
Information query