Invention Grant
- Patent Title: Industrial automatic-diagnostic device
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Application No.: US13881106Application Date: 2010-12-09
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Publication No.: US09678160B2Publication Date: 2017-06-13
- Inventor: Tomo Horikawa , Kunio Ooba , Taku Watanabe
- Applicant: Tomo Horikawa , Kunio Ooba , Taku Watanabe
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Agent Richard C Turner
- International Application: PCT/JP2010/072118 WO 20101209
- International Announcement: WO2012/077210 WO 20120614
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G05B23/02

Abstract:
An industrial automatic-diagnostic device connected to an FA system in which a plurality of FA devices are connected to each other, the industrial automatic-diagnostic device includes: an engineering tool; and a display unit. Based on interface connection information and device configuration information of a corresponding FA device held by each of the FA devices, the engineering tool creates overall configuration information of the FA system and displays an overall configuration of the FA system on the display unit based on the overall configuration information. When an abnormality occurs in the FA device, diagnosis information about an abnormal part self-diagnosed by the FA device and abnormality contents with respect to the abnormality occurred in a corresponding abnormal part is obtained. Based on the obtained diagnosis information, occurrence of an abnormality is displayed in an abnormal part in an overall configuration of the FA system displayed on the display unit.
Public/Granted literature
- US20130241586A1 INDUSTRIAL AUTOMATIC-DIAGNOSTIC DEVICE Public/Granted day:2013-09-19
Information query
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