The present disclosure relates to a peripheral test circuit of a display array substrate, and a liquid crystal display panel. The peripheral test circuit of a display array substrate includes: multiple groups of test signal lines, each group consisting of a first and a second test signal lines spaced from each other; a plurality of test pad leads, each being arranged in an interval formed between the first and the second test signal lines of a respective group, and connected with the first and the second test signal lines but not overlapped with the first and the second test signal lines of other groups; and a plurality of test pads, each being arranged on a respective test pad lead. According to the peripheral test circuit of the present disclosure, the problem existing in the current peripheral test circuit, i.e., a short circuit formed between the test pad lead and the test signal line due to electrostatic discharge caused by crossover between the test pad lead and the test signal line, can be overcome, thus reducing the injury risk of electrostatic discharge.