Invention Grant
- Patent Title: Abnormality diagnostic system and industrial machinery
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Application No.: US13881543Application Date: 2011-10-20
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Publication No.: US09678845B2Publication Date: 2017-06-13
- Inventor: Hideaki Suzuki , Kozo Nakamura , Shinya Yuda , Hiroki Uchiyama
- Applicant: Hideaki Suzuki , Kozo Nakamura , Shinya Yuda , Hiroki Uchiyama
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- Priority: JP2010-242180 20101028
- International Application: PCT/JP2011/074218 WO 20111020
- International Announcement: WO2012/057001 WO 20120503
- Main IPC: G01F19/00
- IPC: G01F19/00 ; G06F11/30 ; G05B23/02 ; G07C3/00

Abstract:
An object of the present invention is to provide an abnormality diagnostic system that can enhance diagnostic precision even if a computer arranged on the machine side does not have sufficient throughput in diagnosing a condition of a machine or equipment based upon time series data generated by a sensor and can reduce communication capacity because communication data volume decreases and industrial machinery provided with the abnormality diagnostic system. A diagnostic device on the machine side 2 diagnoses time series data generated by a sensor, acquires a primary diagnostic result, extracts time series data related to the primary diagnostic result and outputs it to a diagnostic device on the server side 3 together with the primary diagnostic result, the diagnostic device on the server side 3 diagnoses the time series data, acquires a secondary diagnostic result, and displays the secondary diagnostic result together with the primary diagnostic result. Besides, the diagnostic device on the server side compares the diagnostic results and updates a diagnostic process of the diagnostic device on the machine side 2 when the diagnostic results are different as a result of the comparison.
Public/Granted literature
- US20130218522A1 ABNORMALITY DIAGNOSTIC SYSTEM AND INDUSTRIAL MACHINERY Public/Granted day:2013-08-22
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