Invention Grant
- Patent Title: Two part programming and erase methods for non-volatile charge trap memory devices
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Application No.: US15040175Application Date: 2016-02-10
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Publication No.: US09679639B2Publication Date: 2017-06-13
- Inventor: Yeonghun Lee
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: William Park & Associates Ltd.
- Priority: KR10-2015-0129935 20150914
- Main IPC: G11C11/56
- IPC: G11C11/56 ; G11C16/14 ; G11C16/34 ; G11C16/26 ; G11C16/08 ; G11C16/04

Abstract:
A semiconductor memory device includes a memory cell array including a plurality of memory cells, a peripheral circuit performing a program operation or erase operation of the memory cell array; and a control logic controlling the peripheral circuit. The control logic controls the peripheral circuit such that a first program allowable voltage applied to bit lines of the memory cell array during a first program operation of the program operation and a second program allowable voltage applied during a second program operation of the program operation are different from each other.
Public/Granted literature
- US20170076803A1 SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF Public/Granted day:2017-03-16
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