Invention Grant
- Patent Title: Semiconductor memory device including a resistance change element and a control circuit for changing resistance of the resistance change element
-
Application No.: US15099660Application Date: 2016-04-15
-
Publication No.: US09679647B2Publication Date: 2017-06-13
- Inventor: Makoto Ueki , Koji Masuzaki , Masaharu Matsudaira , Takashi Hase , Yoshihiro Hayashi
- Applicant: Renesas Electronics Corporation
- Applicant Address: JP Tokyo
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Tokyo
- Agency: Shapiro, Gabor and Rosenberger, PLLC
- Priority: JP2015-117585 20150610
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00

Abstract:
Included are memory cells each including a resistance change element and a control circuit. The circuit performs an On writing process for applying, to the memory cell, an On writing pulse for the cell to be in a resistance state where a resistance value of the resistance change element is lower than a first reference value and an Off writing process for applying an Off writing pulse with an opposite polarity to the On writing pulse for a high resistance state with a second reference value or greater. The circuit applies, in the On writing process, a trial pulse having the same polarity as that of the On writing pulse and having the pulse width shorter than that of the On writing pulse and a reset pulse having the same polarity as that of the On writing pulse, in this order before applying the On writing pulse to the cell.
Public/Granted literature
- US20160365144A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2016-12-15
Information query