Invention Grant
- Patent Title: Systems and methods for measuring mechanical properties of deformable materials
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Application No.: US13172787Application Date: 2011-06-29
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Publication No.: US09693728B2Publication Date: 2017-07-04
- Inventor: Jason D. Harry , Blair A. Barbour , David Scott Ackerson , Francois I. Luks
- Applicant: Jason D. Harry , Blair A. Barbour , David Scott Ackerson , Francois I. Luks
- Applicant Address: US RI Providence US FL Kissimmee
- Assignee: LUCIDUX, LLC,PHOTON-X, INC.
- Current Assignee: LUCIDUX, LLC,PHOTON-X, INC.
- Current Assignee Address: US RI Providence US FL Kissimmee
- Agency: Cooper Legal Group LLC
- Main IPC: A61B5/00
- IPC: A61B5/00

Abstract:
Systems and methods deform the surface of the material with a probe, such as a mechanical device or a gas/liquid jet, while optically recording in detail the three-dimensional (3D) topography of the resulting surface deformation. The probe effectively applies a forcing function to the material, the attributes of which are known by performing calibrations prior to use or by direct measurement while it is applied. The topography is effectively the system output that is measured as indicative of the underlying mechanical properties of the material. In one application, systems and methods that apply a pressure in-vivo to human tissue and analyze a three-dimensional topography of the resulting surface deformation to identify localized inhomogeneities and anomalies in the human tissue.
Public/Granted literature
- US20110319791A1 Systems and Methods for Measuring Mechanical Properties of Deformable Materials Public/Granted day:2011-12-29
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