Invention Grant
- Patent Title: Determination and correction of frequency registration deviations for quantitative spectroscopy
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Application No.: US14817119Application Date: 2015-08-03
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Publication No.: US09696204B2Publication Date: 2017-07-04
- Inventor: Xiang Liu , Gary Yeh , Adam S. Chaimowitz , William Jenko , Alfred Feitisch
- Applicant: SpectraSensors, Inc.
- Applicant Address: US CA Rancho Cucamonga
- Assignee: SPECTRASENSORS, INC.
- Current Assignee: SPECTRASENSORS, INC.
- Current Assignee Address: US CA Rancho Cucamonga
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01J3/28

Abstract:
A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
Public/Granted literature
- US20170038257A1 Determination and Correction of Frequency Registration Deviations for Quantitative Spectroscopy Public/Granted day:2017-02-09
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