Invention Grant
- Patent Title: Malfunction diagnosis apparatus
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Application No.: US14320769Application Date: 2014-07-01
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Publication No.: US09696220B2Publication Date: 2017-07-04
- Inventor: Hiroki Shimizu , Keita Taniguchi
- Applicant: Toshiba Alpine Automotive Technology Corporation
- Applicant Address: JP Iwaki-shi
- Assignee: Toshiba Alpine Automotive Technology Corporation
- Current Assignee: Toshiba Alpine Automotive Technology Corporation
- Current Assignee Address: JP Iwaki-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2014-011353 20140124
- Main IPC: G01K15/00
- IPC: G01K15/00 ; G01K7/22

Abstract:
A malfunction diagnosis apparatus includes: a first temperature detector; a second temperature detector that is placed in a different location from where the first temperature detector is placed; a difference value calculation device calculates a difference value between a detection value from the first temperature detector and a detection value from the second temperature detector; a mapping device carries out mapping of the difference value and calculates a correction value using the frequency of the difference value; a malfunction diagnosis device diagnoses whether or not there is a malfunction in the first temperature detector and the second temperature detector; and a recovery device calculates, as a detection value of the first or second temperature detector judged to be malfunctioning, a value by adding the correction value to a detection value from the first or second temperature detector judged not to be malfunctioning.
Public/Granted literature
- US20150211945A1 MALFUNCTION DIAGNOSIS APPARATUS Public/Granted day:2015-07-30
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