An apparatus for thermal conductance measurement includes a first heater assembly having a beam, a platen disposed at an end of the beam, and a heating element and a Resistance Temperature Device (RDT) disposed on the platen. The embodiment further includes a second heater assembly having a second beam, a second platen disposed at an end of the second beam, and a second heating element and a second Resistance Temperature Device (RDT) disposed on the platen. A test rig is also included, and the first heater and second heater assembly are mated to the test rig and separated by a gap length.