Invention Grant
- Patent Title: Attached matter testing device and testing method
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Application No.: US14349672Application Date: 2012-10-02
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Publication No.: US09696288B2Publication Date: 2017-07-04
- Inventor: Hideo Kashima , Masakazu Sugaya , Koichi Terada , Yasunori Doi , Yasutaka Suzuki , Hisashi Nagano , Yuichiro Hashimoto , Yasuaki Takada
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- Priority: JP2011-221847 20111006
- International Application: PCT/JP2012/075459 WO 20121002
- International Announcement: WO2013/051530 WO 20130411
- Main IPC: G01N1/26
- IPC: G01N1/26 ; G01N33/00 ; G01N1/22 ; G01N1/02

Abstract:
Provided is a technique to identify a sample substance attached to an inspection target easily and precisely, while improving the rate of operation and reducing the number of persons required for inspection. A trace detecting system includes detection means to detect the size (vertical and horizontal dimensions) of an inspection target, and selects an air nozzle capable of spraying air jet at 15 m/s or more to the surface of the inspection target for air jet spraying.
Public/Granted literature
- US20140238106A1 ATTACHED MATTER TESTING DEVICE AND TESTING METHOD Public/Granted day:2014-08-28
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