- Patent Title: Sample conveyor apparatus and specimen testing automation system
-
Application No.: US14422716Application Date: 2013-08-30
-
Publication No.: US09696330B2Publication Date: 2017-07-04
- Inventor: Tomoyuki Nemoto , Tatsuya Fukugaki , Naoto Tsujimura
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-211651 20120926
- International Application: PCT/JP2013/073417 WO 20130830
- International Announcement: WO2014/050437 WO 20140403
- Main IPC: B65G15/00
- IPC: B65G15/00 ; G01N35/04 ; B65G21/20 ; B65G15/22 ; B65G23/44 ; B65G23/04

Abstract:
In a conventional conveyor line, an empty specimen rack conveyor line is provided separately from a specimen rack conveyor line having a specimen mounted thereon. However, crossing of the conveyor lines leads to the decrease in processing speed. Also, when a specimen rack conveyor line and an empty specimen rack conveyor line are configured on two stages, a vertical movement mechanism needs to be added in order to connect the upper-stage conveyor line and the lower-stage conveyor line, and there is a possibility that the system is complicated and the cost thereof is increased. In the present invention, by connecting an empty holder conveyor line and a main conveyor line disposed up and down on two stages via one conveyor line having a horizontal part and an inclined part, crossing of the conveyor lines can be eliminated and an inexpensive structure can be achieved.
Public/Granted literature
- US20150233955A1 SAMPLE CONVEYOR APPARATUS AND SPECIMEN TESTING AUTOMATION SYSTEM Public/Granted day:2015-08-20
Information query
IPC分类: