- Patent Title: Apparatus and method of fault detection and location determination
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Application No.: US13469208Application Date: 2012-05-11
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Publication No.: US09696367B2Publication Date: 2017-07-04
- Inventor: Charles J. Kim
- Applicant: Charles J. Kim
- Applicant Address: US DC Washington
- Assignee: Howard University
- Current Assignee: Howard University
- Current Assignee Address: US DC Washington
- Agency: Fitch, Even, Tabin & Flannery LLP
- Main IPC: G01R31/08
- IPC: G01R31/08

Abstract:
A distance from a measurement point to a fault in a three-phase circuit is determined. The measurement point is located at an output of a power sub-station and the three phase circuit has a loop circuit having an associated net fault line current and a ground current. A derivative of the net fault line current of the loop circuit as measured from the measurement point is calculated. An uncompensated distance to the sub-cycle fault using at least the derivative of the net fault current is determined, and configured, to compensate for the ground current of the loop circuit. The compensation is applied to the uncompensated distance to produce a compensated distance to the sub-cycle fault.
Public/Granted literature
- US20130304406A1 Apparatus and Method of Fault Detection and Location Determination Public/Granted day:2013-11-14
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