- Patent Title: Radiation measurement apparatus and radiation measurement method
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Application No.: US14853798Application Date: 2015-09-14
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Publication No.: US09696433B2Publication Date: 2017-07-04
- Inventor: Koji Yasui
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc., IP Division
- Priority: JP2014-187592 20140916
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01T1/24 ; G01T1/29

Abstract:
A radiation measurement apparatus includes an array-type radiation detector and an information calculation unit which obtains information on energies detected by pixels of the detector and information on a pixel on which a radiation ray is incident. The information calculation unit includes an energy conversion unit which converts a detected signal of a pixel which is equal to or larger than a predetermined threshold value into a detected energy value, a judgment value calculation unit which obtains a judgment value used to judge whether Compton scattering has been generated in the pixel in accordance with the detected energy, a judgment unit which judges whether the Compton scattering has been generated in the pixel in accordance with the judgment value, and a determination unit which obtains information on a pixel on which a radiation ray is first incident in accordance with a result of the judgment performed by the judgment unit.
Public/Granted literature
- US20160077219A1 RADIATION MEASUREMENT APPARATUS AND RADIATION MEASUREMENT METHOD Public/Granted day:2016-03-17
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