A method comprises receiving, in a computer, an input indicative of a drawing of at least a portion of at least one layer of a semiconductor device. The at least one portion of the at least one layer is compared to corresponding portions in corresponding layers of a plurality of previously defined devices stored in a non-transitory machine readable storage medium. Each layer of at least one of the plurality of previously defined devices for which the corresponding portion in the corresponding layer matches the at least one portion of the at least one layer of the semiconductor device is displayed on a display device.