Invention Grant
- Patent Title: Image capturing device and method for detecting image deformation thereof
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Application No.: US14303568Application Date: 2014-06-12
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Publication No.: US09697604B2Publication Date: 2017-07-04
- Inventor: Yu-Chih Wang , Hong-Long Chou , Che-Lun Chuang , Yao-Sheng Wang
- Applicant: Altek Semiconductor Corp.
- Applicant Address: TW Hsinchu
- Assignee: Altek Semiconductor Corp.
- Current Assignee: Altek Semiconductor Corp.
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW103103259A 20140128
- Main IPC: H04N13/00
- IPC: H04N13/00 ; G06T7/00 ; H04N13/02 ; G06T7/80

Abstract:
An image capturing device and a method for detecting image deformation thereof are provided. The method is for the image capturing device having a first sensor and a second image sensor, and the method includes the following steps. A first image is captured through the first image sensor, and a second image is captured through the second image sensor. A deform detection is performed according to the first and second images so as to obtain a comparison information between the first and second images. Whether a coordinate parameter relationship between the first and second images being varied is determined according to the comparison information, in which the coordinate parameter relationship is associated with a spatial configuration relationship between the first and second image sensors.
Public/Granted literature
- US20150213588A1 IMAGE CAPTURING DEVICE AND METHOD FOR DETECTING IMAGE DEFORMATION THEREOF Public/Granted day:2015-07-30
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