Invention Grant
- Patent Title: Method of measuring interference
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Application No.: US14154998Application Date: 2014-01-14
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Publication No.: US09699046B2Publication Date: 2017-07-04
- Inventor: Jae Hoon Chung , Hyun Soo Ko , Moon Il Lee , Bin Chul Ihm
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: Lee, Hong, Degerman, Kang & Waimey
- Priority: KR10-2008-0071821 20080723
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G06F11/00 ; G08C15/00 ; H04J1/16 ; H04J3/14 ; H04L1/00 ; H04L12/26 ; H04L5/00 ; H04B17/345 ; H04B17/373

Abstract:
A method of measuring interference to perform efficient data communication is disclosed. A method of measuring interference of neighboring cells comprises allocating one or more first resource elements, to which pilot signals are allocated, to predetermined symbol regions included in a first resource block; allocating one or more second resource elements for measuring interference of the neighboring cells to a first symbol region of the predetermined symbol regions; and measuring interference of the neighboring cells using the one or more second resource elements.
Public/Granted literature
- US20140169202A1 METHOD OF MEASURING INTERFERENCE Public/Granted day:2014-06-19
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