Invention Grant
- Patent Title: Non-permanent termination structure for microprobe measurements
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Application No.: US14751792Application Date: 2015-06-26
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Publication No.: US09702906B2Publication Date: 2017-07-11
- Inventor: Matteo Cocchini , Michael A. Cracraft , Jayapreetha Natesan , John G. Torok
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Reza Sarbakhsh
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R1/04 ; G01R31/28
Abstract:
A structure and method of facilitating testing of an electronic device (device under test or DUT) using a non-permanent and reusable structure to terminate contact pads and contact pin holes on a surface of the DUT.
Public/Granted literature
- US20160377654A1 NON-PERMANENT TERMINATION STRUCTURE FOR MICROPROBE MEASUREMENTS Public/Granted day:2016-12-29
Information query
