Invention Grant
- Patent Title: Magnetic measurement device
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Application No.: US14374640Application Date: 2012-12-13
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Publication No.: US09702945B2Publication Date: 2017-07-11
- Inventor: Kenichi Suzuki , Tsutomu Chikamatsu , Akio Ogawa , Kyung-ku Choi , Ryuji Hashimoto
- Applicant: TDK CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TDK CORPORATION
- Current Assignee: TDK CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2012-014551 20120126
- International Application: PCT/JP2012/082276 WO 20121213
- International Announcement: WO2013/111467 WO 20130801
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G01R33/10

Abstract:
A magnetic measurement device which can measure the magnetic characteristics in a microregion of a thin plate magnetic sample. After a magnetic sample is applied by a magnetic field and magnetized accordingly, by scanning the magnetic sample using a measuring part, the magnetic flux leakage in the magnetic sample can be measured. The magnetic flux leaks outside by magnetizing a first region and a second region of the magnetic sample in reciprocally opposite directions and reducing the demagnetizing field. Specifically, a magnetic field generating part with at least a pair of magnetic poles is used to perform the magnetization of multiple poles, or the magnetic field generating part applies a damped oscillation magnetic field to perform the magnetization, or a local magnetic field generating part which applies an alternating magnetic field and scans the surface of the sample at the same time is used to perform the magnetization.
Public/Granted literature
- US20140375308A1 MAGNETIC MEASUREMENT DEVICE Public/Granted day:2014-12-25
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