Invention Grant
- Patent Title: Three-dimensional shape measurement device, three-dimensional shape measurement method, and three-dimensional shape measurement program
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Application No.: US14886896Application Date: 2015-10-19
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Publication No.: US09704255B2Publication Date: 2017-07-11
- Inventor: Hiroki Unten , Tatsuya Ishii
- Applicant: TOPPAN PRINTING CO., LTD.
- Applicant Address: JP Taito-ku
- Assignee: TOPPAN PRINTING CO., LTD.
- Current Assignee: TOPPAN PRINTING CO., LTD.
- Current Assignee Address: JP Taito-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-088555 20130419
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01B11/24 ; G06T17/20 ; H04N5/225 ; H04N13/02 ; G06T7/593

Abstract:
A device for measuring a three-dimensional shape includes an imaging unit which sequentially outputs a first two-dimensional image being captured and outputs a second two-dimensional image according to an output instruction, the second two-dimensional image having a setting different from a setting of the first two-dimensional image, an output instruction generation unit which generates the output instruction based on a shape defect ratio obtained by generating a three-dimensional model based on the second two-dimensional image outputted by the imaging unit and viewing a three-dimensional model from a viewpoint at which the first two-dimensional image is captured, and a storage unit which stores the second two-dimensional image outputted by the imaging unit.
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