Invention Grant
- Patent Title: Image capturing device and method for calibrating image defection thereof
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Application No.: US14645427Application Date: 2015-03-12
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Publication No.: US09706189B2Publication Date: 2017-07-11
- Inventor: Hong-Long Chou , Ming-Jiun Liaw , Simon Mong-Lun Law , Ching-Lung Tsai , Yu-Chih Wang
- Applicant: Altek Semiconductor Corp.
- Applicant Address: TW Hsinchu
- Assignee: Altek Semiconductor Corp.
- Current Assignee: Altek Semiconductor Corp.
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW103103261A 20140128
- Main IPC: H04N5/232
- IPC: H04N5/232 ; H04N13/02 ; G02B13/00 ; G06K9/62 ; H04N17/00 ; G03B13/36 ; G03B43/00 ; G06T7/80 ; G06T7/50 ; G06K9/00 ; H04N13/00

Abstract:
A method for calibrating image defection of an image capturing device having a first and second lens, a focusing actuator, and a prestored first focusing step-to-focusing distance relation includes the following steps. A plurality of image sets are captured by the first and second lens, where each of the image sets includes a first and second image, and the images sets include a reference image set. It is detected whether the reference image set is defective. When the reference image set is detected to be defective, the first focusing step-to-focusing distance relation is calibrated according to a focusing step and a focusing distance corresponding to each of the image sets, where the focusing step corresponding to each of the image sets is the number of steps that the focusing actuator is required to move the first and second lens to a focusing position to generate each of the image sets.
Public/Granted literature
- US20150215615A1 IMAGE CAPTURING DEVICE AND METHOD FOR CALIBRATING IMAGE DEFECTION THEREOF Public/Granted day:2015-07-30
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