A method and a device for the inspection of surfaces of an examined object includes illuminating a the surface using an illumination unit and capturing an image of the surface using an area image sensor. The captured images are forwarded to an image analysis unit configured to ascertain surface anomalies as defect areas and delimit, if required, the defect areas in a segmentation relative to one another or against the image background, to summarize defect areas belonging together in a regional analysis, to derive characteristic defects from defect areas or defect regions in a feature extraction or both.