Invention Grant
- Patent Title: System and method for detecting a defect in a structure member
-
Application No.: US14624728Application Date: 2015-02-18
-
Publication No.: US09709437B2Publication Date: 2017-07-18
- Inventor: Denvid Lau , Tin Kei Cheng
- Applicant: City University of Hong Kong
- Applicant Address: HK Hong Kong
- Assignee: City University of Hong Kong
- Current Assignee: City University of Hong Kong
- Current Assignee Address: HK Hong Kong
- Agency: Renner Kenner Greive Bobak Taylor & Weber
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01H9/00

Abstract:
A method for detecting a defect in a structure member includes exciting a structure member by applying an excitation signal to the structure member, applying an optical signal to the excited structure member and capturing a reflected optical signal formed by a reflection of the applied optical signal by the excited structure member, and processing the reflected optical signal to determine one or more defects in the structure member.
Public/Granted literature
- US20160238534A1 SYSTEM AND METHOD FOR DETECTING A DEFECT IN A STRUCTURE MEMBER Public/Granted day:2016-08-18
Information query