The invention relates to a method for localizing a defect in an electrochemical store (165). The method includes a step of controlling the temperature of a subarea (145, 150, 155, 160, 170) of the electrochemical store (165) to increase an internal pressure of the subarea (145, 150, 155, 160, 170), a step of detecting a measured value which represents an escape of a component from the subarea (145, 150, 155, 160, 170) occurring in response to the increased internal pressure of the subarea (145, 150, 155, 160, 170), and a step of localizing the defect in the subarea (145, 150, 155, 160, 170) when the measured value is in a predetermined relation to a comparison value.