Invention Grant
- Patent Title: Refractive index distribution measuring method, refractive index distribution measuring apparatus, and optical element manufacturing method
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Application No.: US14959878Application Date: 2015-12-04
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Publication No.: US09709490B2Publication Date: 2017-07-18
- Inventor: Tomohiro Sugimoto
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc., IP Division
- Priority: JP2014-248475 20141208; JP2015-190070 20150928
- Main IPC: G01N21/41
- IPC: G01N21/41 ; G01N21/45 ; G01M11/02 ; G01N21/958

Abstract:
A test unit is formed by sandwiching a test lens by a first reference lens whose shape and refractive index are known, a second reference lens whose shape and refractive index are known, and a medium. A wavefront of light transmitted through the test unit is measured, and, by using the shape and the refractive index of the first reference lens, the shape and refractive index of the second reference lens, and the measured wavefront of the test unit, the refractive index distribution of the test lens is calculated.
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