Invention Grant
- Patent Title: Automatic analyzer and reagent processing method in automatic analyzer
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Application No.: US14370076Application Date: 2012-12-26
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Publication No.: US09709587B2Publication Date: 2017-07-18
- Inventor: Takaaki Hagiwara , Kazunori Yamazawa , Hiroki Fujita
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-000837 20120105
- International Application: PCT/JP2012/083745 WO 20121226
- International Announcement: WO2013/103119 WO 20130711
- Main IPC: G01N35/00
- IPC: G01N35/00 ; B01J19/00 ; G01N35/10 ; G01N35/04

Abstract:
An automatic analyzer is capable of performing a preparation process on a reagent used to measure a highly urgent test item even during analysis operation, and is configured as follows. If there is no parameter for the analysis item regarding a new reagent, the parameters are downloaded. If the priority of reagent preparation is “high,” a sample pipetting scheduling process is temporarily stopped. If the priority of reagent preparation is not “high,” it is determined whether a waiting time limit has been exceeded, and if it has, the sample pipetting scheduling process is stopped temporarily, reagent preparation scheduling is performed, and the sample pipetting scheduling process is resumed. If it is determined that the waiting time limit has not been exceeded, if the priority of reagent preparation is “medium,” and if the reagent preparation mechanism is found available, then reagent preparation scheduling is performed.
Public/Granted literature
- US20140356233A1 AUTOMATIC ANALYSIS DEVICE AND REAGENT PROCESSING METHOD IN AUTOMATIC ANALYSIS DEVICE Public/Granted day:2014-12-04
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