Invention Grant
- Patent Title: Light-emitting element failure detector and method for detecting light-emitting element failure
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Application No.: US14130163Application Date: 2012-06-28
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Publication No.: US09709637B2Publication Date: 2017-07-18
- Inventor: Toshiya Iwakiri
- Applicant: Toshiya Iwakiri
- Applicant Address: JP Tokyo
- Assignee: NEC Lighting, Ltd.
- Current Assignee: NEC Lighting, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Wilmer Cutler Pickering Hale and Dorr LLP
- Priority: JP2011-148536 20110704
- International Application: PCT/JP2012/066610 WO 20120628
- International Announcement: WO2013/005652 WO 20130110
- Main IPC: G01R31/44
- IPC: G01R31/44 ; H05B33/08

Abstract:
A light emitting element circuit includes a light emitting element (1), a current supply path to the light emitting element (1), a constant current circuit (2) that supplies a current to the light emitting element (1) via the current supply path, and an electric discharge path that discharges an electric charge accumulated at the light emitting element (1) and at a region connected between the both electrodes when the constant current circuit (2) stops a current supply to the light emitting element (1). A light emitting element failure detector (4) that detects a short-circuit of the light emitting element (1) in a light emitting element circuit includes a current instantaneous interruption circuit (5), a voltage detector (60), and a determiner (62). The current instantaneous interruption circuit (5) is arranged on the current supply path different from the electric discharge path and instantaneously interrupts an electric current that the constant current circuit (2) supplies to the light emitting element (1). The voltage detector (60) obtains an output of a voltage Vf between the anode and cathode of the light emitting element (1) during a period of the instantaneous interruption as a measuring object. The determiner (62) determines the existence of a short-circuit from the output.
Public/Granted literature
- US20140139227A1 Light-Emitting Element Failure Detector and Method for Detecting Light-Emitting Element Failure Public/Granted day:2014-05-22
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