Invention Grant
- Patent Title: Method and system for optimizing configurable parameters of inspection tools
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Application No.: US14801600Application Date: 2015-07-16
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Publication No.: US09711327B2Publication Date: 2017-07-18
- Inventor: Dan Koronel , Amir Wilde
- Applicant: Applied Materials Israel Ltd.
- Applicant Address: IL Rehovot
- Assignee: Applied Materials Israel, Ltd.
- Current Assignee: Applied Materials Israel, Ltd.
- Current Assignee Address: IL Rehovot
- Agency: Lowenstein Sandler LLP
- Main IPC: G01N23/00
- IPC: G01N23/00 ; H01J37/26 ; H01J37/22 ; H01J37/244

Abstract:
A method, computer product and system for optimization of configurable parameters of inspection tools are provided. The method includes applying a heuristic that utilizes a prioritized sequence of selections of configurable parameters. For each configuration setting of the heuristic the method includes providing a set of local scan images of a list of DOIs, calculating an optimization target function and updating the configuration settings with the best value of each scanned parameter according to said prioritization heuristic. The method includes outputting the one or more updated configuration settings to a recipe file.
Public/Granted literature
- US20170018403A1 METHOD AND SYSTEM FOR OPTIMIZING CONFIGURABLE PARAMETERS OF INSPECTION TOOLS Public/Granted day:2017-01-19
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