Invention Grant
- Patent Title: Semiconductor device and method of fabricating the same
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Application No.: US15285682Application Date: 2016-10-05
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Publication No.: US09711531B2Publication Date: 2017-07-18
- Inventor: Woong-Seop Lee , Jongyoon Choi , Jinhyun Shin , Dong-Sik Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Ward and Smith, P.A.
- Priority: KR10-2015-0174317 20151208
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L27/11582 ; H01L29/10 ; H01L27/11568 ; H01L29/04 ; H01L27/11565 ; H01L29/423 ; H01L21/02

Abstract:
A method of fabricating a semiconductor device can include forming a channel hole in a vertical stack of alternating insulating and sacrificial layers to form a recess in a substrate. A selectively epitaxial growth can be performed to provide a lower semiconductor pattern in the recess using material of the substrate as a seed and a recess can be formed to penetrate an upper surface of the lower semiconductor pattern via the channel hole.
Public/Granted literature
- US20170103997A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Public/Granted day:2017-04-13
Information query
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