Invention Grant
- Patent Title: Dual isolation fin and method of making
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Application No.: US14963446Application Date: 2015-12-09
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Publication No.: US09711617B2Publication Date: 2017-07-18
- Inventor: Cheng-Wei Cheng , Sanghoon Lee , Effendi Leobandung
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Louis Percello
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/02 ; H01L29/20 ; H01L21/308 ; H01L29/78 ; H01L21/762 ; H01L29/06

Abstract:
A method of making a dual isolation fin comprises applying a mask to a substrate and etching the exposed areas of the substrate to form a mandrel; forming a dielectric layer on the surface of the substrate and adjacent to the mandrel; forming a first epitaxially formed material on the exposed portions of the mandrel; forming a second epitaxially formed material on the first epitaxially formed material; forming a first isolation layer on the dielectric layer and adjacent to the second epitaxially formed material; removing the mask and mandrel after forming the first isolation layer; removing the first epitaxially formed material after removing the mask and mandrel; and forming a second isolation layer.
Public/Granted literature
- US20170170297A1 DUAL ISOLATION FIN AND METHOD OF MAKING Public/Granted day:2017-06-15
Information query
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