Invention Grant
- Patent Title: Method and apparatus for fault detection for imager decoder
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Application No.: US14627630Application Date: 2015-02-20
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Publication No.: US09712768B2Publication Date: 2017-07-18
- Inventor: Yoshiharu Tani , John Drinkard
- Applicant: Omron Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON CORPORATION
- Current Assignee: OMRON CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H04N5/365
- IPC: H04N5/365 ; H04N17/00

Abstract:
The teachings herein provide a method and apparatus for detecting erroneous pixel addressing in an imaging sensor. The method and apparatus advantageously leverage the characteristic “fixed pattern noise” of the sensor to detect addressing errors. Broadly, pixel addressing errors are detected based on comparing the pattern noise seen in data read outs from a targeted address of the sensor with characteristic fixed pattern noise known for the sensor.
Public/Granted literature
- US09681075B2 Method and apparatus for fault detection for imager decoder Public/Granted day:2017-06-13
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