- Patent Title: Method for evaluating spline parameters for smooth curve sampling
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Application No.: US14457699Application Date: 2014-08-12
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Publication No.: US09715741B2Publication Date: 2017-07-25
- Inventor: David McLean Carron
- Applicant: Infragistics, Inc.
- Applicant Address: US NJ Cranbury
- Assignee: Infragistics, Inc.
- Current Assignee: Infragistics, Inc.
- Current Assignee Address: US NJ Cranbury
- Agency: Moser Taboada
- Main IPC: G06T11/20
- IPC: G06T11/20 ; G06T7/60 ; G06F3/041 ; G06F3/0354

Abstract:
A computer implemented method and apparatus for reproducing an input curve on a mobile device comprising detecting the input curve, sampling the input curve into a discrete set of vertices, performing a normalized dot product of an edge leading into each one of the discrete set of vertices and a tangent to an edge leading from each one of the discrete set of vertices, setting one or more spline stiffness parameter based on the normalized dot product corresponding to each vertex; and converting the sampled input curve into one or more spline patch with the set spline stiffness parameter corresponding to each vertex.
Public/Granted literature
- US20140347271A1 METHOD FOR EVALUATING SPLINE PARAMETERS FOR SMOOTH CURVE SAMPLING Public/Granted day:2014-11-27
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