Invention Grant
- Patent Title: Temperature code circuit with single ramp for calibration and determination
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Application No.: US14814277Application Date: 2015-07-30
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Publication No.: US09715913B1Publication Date: 2017-07-25
- Inventor: Jiang Yin , Jongmin Park , Emilio Yero , Steve Choi
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Plano
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Plano
- Main IPC: G11C7/22
- IPC: G11C7/22 ; G01K7/00 ; H03K4/50 ; G05F3/24

Abstract:
Techniques and circuitry are presented for more rapidly and accurately obtaining a temperature code (TCO) on an integrated circuit. A comparison voltage is ramped up and two counts are determined concurrently, a first count on how many clock cycles for the comparison voltage to ramp up from a low reference voltage to a proportional to absolute temperature (PTAT) and a second count for the number of clock cycles for the comparison voltage to go from the low reference voltage to a high reference voltage. The TCO value is then obtained by using the second count in a post-processing calibration to adjust the first count. An initial calibration can also be included when the circuit is powered up.
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