Invention Grant
- Patent Title: Charged particle beam drawing apparatus, format check apparatus and format check method
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Application No.: US14263160Application Date: 2014-04-28
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Publication No.: US09715994B2Publication Date: 2017-07-25
- Inventor: Kenichi Yasui
- Applicant: NuFlare Technology, Inc
- Applicant Address: JP Yokohama
- Assignee: NuFlare Technology, Inc
- Current Assignee: NuFlare Technology, Inc
- Current Assignee Address: JP Yokohama
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-095032 20130430
- Main IPC: A61N5/00
- IPC: A61N5/00 ; H01J37/317

Abstract:
A charged particle beam drawing apparatus in an embodiment includes an information generation part to generate encoded information on drawing data having a layered structure and check information on the format check, if the drawing data passes the check by the format check part; an information storage part to store the encoded information and the check information; a code inspection part to inspect the drawing data by using the encoded information in the information storage part, when the drawing data is to be rechecked in the format check based on the check details; an information inspection part to inspect the check information in the information storage part while omitting the format check, if the drawing data passes the inspection by the code inspection part; and a check execution part to execute check with processing details of the format check changed according to the inspection result.
Public/Granted literature
- US20140319384A1 CHARGED PARTICLE BEAM DRAWING APPARATUS, FORMAT CHECK APPARATUS AND FORMAT CHECK METHOD Public/Granted day:2014-10-30
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