An electrostatic discharge clamp circuit is provided for low power applications. The clamp circuit includes: a detection circuit, a bias circuit and a shunting circuit having at least one shunt transistor. The detection circuit is configured to detect an occurrence of an electrostatic charge on a power supply node and trigger discharge of the electrostatic charge through the shunting circuit. The bias circuit is coupled between the detection circuit and the shunting circuit and applies a bias voltage to the gate terminal of the shunt transistor. During an electrostatic discharge event, the bias circuit is configured to generate a bias voltage that is substantially equal to the supply voltage; whereas, during the absence of an electrostatic discharge event, the bias circuit is configured to generate a bias voltage that is substantially half of the supply voltage.