Invention Grant
- Patent Title: Aligning source-grating-to-phase-grating distance for multiple order phase tuning in differential phase contrast imaging
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Application No.: US14421008Application Date: 2013-08-20
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Publication No.: US09717470B2Publication Date: 2017-08-01
- Inventor: Gerhard Martens , Heiner Daerr , Thomas Detlef Istel , Ewald Roessl , Udo Van Stevendaal
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/IB2013/056748 WO 20130820
- International Announcement: WO2014/030115 WO 20140227
- Main IPC: G01N23/04
- IPC: G01N23/04 ; A61B6/00 ; G01N23/20

Abstract:
An X-ray imaging method includes acquiring a differential phase contrast imaging X-ray scan with an X-ray imaging system having an X-ray source, an X-ray detector, and a grating arrangement having a source grating, a phase grating and an analyzer grating. The source grating is misaligned in respect to an interferometer such that moiré fringes are detectable in the plane of the detector. A translation signal is computed for translating the source grating for achieving a predetermined moiré pattern. The positioning of the source grating is adjusted in an X-ray projection direction based on the translation signal such that at least 2 pi of phase changes are covered with the Moiré fringes over the width of the detector. And a further differential phase contrast imaging X-ray scan is acquired.
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