- Patent Title: Examining apparatus, examining method and image recording apparatus
-
Application No.: US15254679Application Date: 2016-09-01
-
Publication No.: US09718292B2Publication Date: 2017-08-01
- Inventor: Yosuke Kimura
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2015-172800 20150902
- Main IPC: B41J29/393
- IPC: B41J29/393 ; H04N1/00 ; B41J2/01

Abstract:
An examining apparatus, examining method and an image recording apparatus which analyze the state of a print image irrespective of variation in contrast performance of an optical unit of a reading device are provided. An examining apparatus includes: a reading device configured to read an image recorded by a recording head to output a reading result and including at least one optical unit including an image capturing element and a lens; an analyzing device configured to analyze a state of the recording head or a state of the image by comparing the reading result to a threshold; an index acquiring device configured to acquire an index indicating contrast performance for each divided reading region obtained by dividing a reading region of the reading device into a plurality of regions; and a correcting device configured to correct the threshold for the divided reading region based on the acquired index.
Public/Granted literature
- US20170057266A1 EXAMINING APPARATUS, EXAMINING METHOD AND IMAGE RECORDING APPARATUS Public/Granted day:2017-03-02
Information query
IPC分类: