Invention Grant
- Patent Title: X-ray interferometric imaging system
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Application No.: US14700137Application Date: 2015-04-29
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Publication No.: US09719947B2Publication Date: 2017-08-01
- Inventor: Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz
- Applicant: Sigray, Inc.
- Applicant Address: US CA Concord
- Assignee: Sigray, Inc.
- Current Assignee: Sigray, Inc.
- Current Assignee Address: US CA Concord
- Agency: Franklin Schellenberg
- Main IPC: G01N23/02
- IPC: G01N23/02 ; A61B6/00 ; G21K1/02 ; G01N23/20 ; H01J35/08

Abstract:
An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, a means to translate the second grating G2 relative to the detector. The system may additionally comprise an antiscattering grid to reduce signals from scattered x-rays. Various configurations of dark-field and bright-field detectors are also disclosed.
Public/Granted literature
- US20150243397A1 X-RAY INTERFEROMETRIC IMAGING SYSTEM Public/Granted day:2015-08-27
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