Invention Grant
- Patent Title: X-ray flourescent analyzer
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Application No.: US14792706Application Date: 2015-07-07
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Publication No.: US09719949B2Publication Date: 2017-08-01
- Inventor: Masahiro Sakuta
- Applicant: Hitachi High-Tech Science Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Banner & Witcoff, Ltd.
- Priority: JP2014-140234 20140708
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01N23/22 ; G01N35/00 ; G01T7/12
Abstract:
A sample plate is for X-ray analysis to which a sample is fixed in performing an analysis using an X-ray fluorescent analyzer, and includes: a plate-like body that supports the sample; and a code-indicated portion provided on the plate-like body in which information on the sample is encoded and indicated.
Public/Granted literature
- US20160011129A1 Sample Plate for X-Ray Analysis and X-Ray Fluorescent Analyzer Public/Granted day:2016-01-14
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